This interactive online workshop will show participants how to see more from their samples through precise preparation and EM imaging techniques. Experts will present a workflow consisting of a combination of mechanical precision preparation and ion beam milling processing.

The example focuses on sample preparation for battery technologies and will show a combination of mechanical precision preparation using the Leica EM TXP and ion beam processing with the Leica EM TIC 3X, resulting in a sample ready for EM imaging.

This interactive online workshop is designed for beginners as well as advanced EM users and provides practical tips for sample preparation.